High-resolution mapping of the optical near-field components at a triangular nano-aperture
نویسندگان
چکیده
منابع مشابه
High-resolution fracture aperture mapping using optical profilometry
[1] Fractures play an important role in the Earth’s crust, often controlling both mechanical and transport processes. Developing a mechanistic understanding of these processes requires quantifying the roughness of fracture surfaces and the contacts and void spaces between fracture surfaces at high spatial resolution (10s of microns) over a broad range of scales (centimeters to meters). Here we ...
متن کاملHigh throughput optical lithography by scanning a massive array of bowtie aperture antennas at near-field
Optical lithography, the enabling process for defining features, has been widely used in semiconductor industry and many other nanotechnology applications. Advances of nanotechnology require developments of high-throughput optical lithography capabilities to overcome the optical diffraction limit and meet the ever-decreasing device dimensions. We report our recent experimental advancements to s...
متن کاملThe optical near-field of an aperture tip
We use fluorescent nanospheres as scalar detectors for the electric-field intensity in order to probe the near-field of an optical tip used in aperture-type near-field scanning optical microscopy (NSOM). Surprisingly, the recorded fluorescence images show two intensity lobes if the sphere diameter is smaller that the aperture diameter, as expected only in the case of vector detectors like singl...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Optics Express
سال: 2005
ISSN: 1094-4087
DOI: 10.1364/opex.13.010688